| Title | Visualization of Test Information to Assist Fault Localization |
| Publication Type | Conference Paper |
| Year of Publication | 2002 |
| Authors | Jones, J. A., M J. Harrold, and J. Stasko |
| Conference Name | Proceedings of the 24th International Conference on Software Engineering |
| Pagination | 467–477 |
| Date Published | 05/2002 |
| Publisher | ACM |
| Conference Location | New York, NY, USA |
| ISBN Number | 1-58113-472-X |
| URL | http://doi.acm.org/10.1145/581339.581397 |
| DOI | 10.1145/581339.581397 |