| Title | Visualization of Test Information to Assist Fault Localization | 
| Publication Type | Conference Paper | 
| Year of Publication | 2002 | 
| Authors | Jones, J. A., M J. Harrold, and J. Stasko | 
| Conference Name | Proceedings of the 24th International Conference on Software Engineering | 
| Pagination | 467–477 | 
| Date Published | 05/2002 | 
| Publisher | ACM | 
| Conference Location | New York, NY, USA | 
| ISBN Number | 1-58113-472-X | 
| URL | http://doi.acm.org/10.1145/581339.581397 | 
| DOI | 10.1145/581339.581397 |