Title | Visualization of Test Information to Assist Fault Localization |
Publication Type | Conference Paper |
Year of Publication | 2002 |
Authors | Jones, J. A., M J. Harrold, and J. Stasko |
Conference Name | Proceedings of the 24th International Conference on Software Engineering |
Pagination | 467–477 |
Date Published | 05/2002 |
Publisher | ACM |
Conference Location | New York, NY, USA |
ISBN Number | 1-58113-472-X |
URL | http://doi.acm.org/10.1145/581339.581397 |
DOI | 10.1145/581339.581397 |