Multiply-Deployed Residual Testing at the Object Level

TitleMultiply-Deployed Residual Testing at the Object Level
Publication TypeConference Proceedings
Year of Publication2004
AuthorsNaslavsky, L., M. Dias, and D. J. Richardson
Conference NameIASTED International Conference on Software Engineering (SE2004)
Date PublishedFebruary
Conference Location Innsbruck, Austria