Saini, V., H. Sajnani, J. Ossher, and C. V. Lopes,
"A Dataset for Maven Artifacts and Bug Patterns Found in Them",
11th Working Conference on Mining Software Repositories (MSR 2014), Hyderabad, India, ACM, pp. 416-419, May 31-June 1, 2014.
Saini, V., H. Sajnani, and C. Lopes,
"Comparing Quality Metrics for Cloned and Non-Cloned Java Methods: A Large Scale Empirical Study",
IEEE 32nd International Conference on Software Maintenance and Evolution (ICSME 2016), Raleigh, North Carolina, USA, IEEE, October, 2016.