Feng, Y., K. Dreef, J. A. Jones, and A. van Deursen,
"Hierarchical Abstraction of Execution Traces for Program Comprehension",
26th IEEE/ACM International Conference on Program Comprehension (ICPC), Gothenburg, Sweden, pp. 86-96, May 27-28, 2018.
Feng, Y., J. A. Jones, Z. Chen, and C. Fang,
"An Empirical Study on Software Failure Classification with Multi-label and Problem-Transformation Techniques",
IEEE 11th International Conference on Software Testing, Verification and Validation (ICST), Vasteras, Sweden, pp. 320-330, April 9-13, 2018.