Saini, V., H. Sajnani, and C. Lopes,
"Comparing Quality Metrics for Cloned and Non-Cloned Java Methods: A Large Scale Empirical Study",
IEEE 32nd International Conference on Software Maintenance and Evolution (ICSME 2016), Raleigh, North Carolina, USA, IEEE, October, 2016.
Saini, V., H. Sajnani, J. Ossher, and C. V. Lopes,
"A Dataset for Maven Artifacts and Bug Patterns Found in Them",
11th Working Conference on Mining Software Repositories (MSR 2014), Hyderabad, India, ACM, pp. 416-419, May 31-June 1, 2014.